Method for using fuse identification codes for masking bad bits on single in-line memory modules
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United States of America Patent
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Jun 15, 1999
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N/A
app pub date -
Aug 22, 1997
filing date -
Sep 20, 1996
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Abstract
A new method for masking off failing memory locations on a Single In-line Memory Module (SIMM) involves reading out identification (ID) codes fused in individual DRAMs. The ID codes are used to index stored fail maps taken from the DRAMs prior to their assembly onto a SIMM. After all failing locations of all of the DRAMs located on a single SIMM are determined, the SIMM is then programmed to re-route these locations to auxiliary memory located on the SIMM.
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