Three dimensional reference image segmenting method and device and object discrimination system

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United States of America Patent

PATENT NO 5917940
SERIAL NO

08787928

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Abstract

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In a three-dimensional reference image segmenting method and device, a two-dimensional image of a reference object and a shape data of a pattern obtained by transforming the image is stored together with depth data of the reference object in a memory as a reference pattern. On the basis of a local Fourier transform image date of an input image supplied from an image transform unit and the reference data of the reference pattern read out from the memory, a deform amount estimating unit calculates the amount of deform (displacement vector) required to make both the images coincident with each other to a possible extent. An inverse Fourier transform unit generates a deformed reference image by an local inverse Fourier transform based on the displacement vector and the data of the local Fourier transform image data of the reference pattern. On the basis of the deformed reference image thus generated, an image segmentation unit extracts a reference object image from within the input image, and the reference object image thus extracted is outputted from an image output unit.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION7-1 SHIBA 5-CHOME MINATO-KU TOKYO 108-8001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miyashita, Masanobu Tokyo, JP 4 64
Okajima, Kenji Tokyo, JP 17 201

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