Method and apparatus for calibrating an intra-operative X-ray system

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United States of America Patent

PATENT NO 5923727
SERIAL NO

08940923

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Apparatus for calibrating an intra-operative X-ray system having an X-ray source and a detector includes an optical camera associated with the X-ray source; an optical camera associated with the detector; an X-ray phantom placed within a field of view of the X-ray system during an off-line process; an optical phantom placed within a field of view of the optical cameras during the off-line process as well as the on-line process (called the patient run); and apparatus for computing a respective projection matrix from an image provided by any of the X-ray source and detector, and the optical cameras. A method to obtain the projection matrices characterizing the X-ray imaging geometry during the patient run, using the projection matrices associated to X-ray geometry as well as the optical cameras computed during an off-line process, and the projection matrices associated to the optical cameras during the patient run. The relative motion of the apparatus between the off-line and on-line process is computed using the projection matrices characterizing the imaging geometry of the optical cameras. This information leads us to the modification of the off-line estimation of X-ray imaging geometry and to the characterization of its on line imaging geometry.

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Patent Owner(s)

  • SIEMENS MEDICAL SOLUTIONS USA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Navab, Nassir Erlangen, DE 84 3661

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