Method and apparatus for measuring the thickness of non-circular elongated workpieces
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 27, 1999
Grant Date -
N/A
app pub date -
Nov 4, 1997
filing date -
Nov 18, 1996
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention relates to a method for measuring the thickness of non-circular elongated workpieces in which the thickness of the workpiece is measured along three measuring axis, the measurements are fed into a computer to determine minimum and maximum values and associated angular positions of the measuring axis, the measuring systems are rotated to a zero measuring position and the measured thicknesses are correlated by an algorithm, and the computer computes the degree for which angular position of the mimimum and maximum changes when the workpiece is advanced.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully