Front-end architecture for a measurement instrument
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United States of America Patent
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Jul 27, 1999
Grant Date -
N/A
app pub date -
Apr 9, 1997
filing date -
Apr 9, 1997
priority date (Note) -
Expired
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Abstract
A front-end architecture is provided for a measurement instrument having a single path for the input signal for conversion into digital samples. A signal conditioner may be coupled via a pair of test leads across a voltage source, current source, or component to develop an input signal. The input signal is provided to a sampling system, which comprises a sigma-delta converter followed by a decimation filter, which over-samples the input signal to produce a continuous stream of digital samples. The digital samples are provided to a set of digital extraction filters, each digital extraction filter having a structure and transfer function adapted for extracting a measurement parameter from the stream of digital samples. Parameter extraction is performed on a continuous basis so that the digital samples and the resulting digital measurement values arrive in a continuous stream. Extracted parameters include the d.c. value of the input signal, the rms value of the input signal, the waveform parameters of the input signal, and the peak min/max values of the input signal.
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Patent Owner(s)
| Patent Owner | Address | |
|---|---|---|
| FLUKE CORPORATION | 6920 SEAWAY BLVD EVERETT WA 98203 |
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Inventor(s)
| Inventor Name | Address | # of filed Patents | Total Citations |
|---|---|---|---|
| Swift, Steven D | Seattle, WA | 5 | 109 |
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| Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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