Front-end architecture for a measurement instrument

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United States of America Patent

PATENT NO 5930745
SERIAL NO

08840086

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Abstract

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A front-end architecture is provided for a measurement instrument having a single path for the input signal for conversion into digital samples. A signal conditioner may be coupled via a pair of test leads across a voltage source, current source, or component to develop an input signal. The input signal is provided to a sampling system, which comprises a sigma-delta converter followed by a decimation filter, which over-samples the input signal to produce a continuous stream of digital samples. The digital samples are provided to a set of digital extraction filters, each digital extraction filter having a structure and transfer function adapted for extracting a measurement parameter from the stream of digital samples. Parameter extraction is performed on a continuous basis so that the digital samples and the resulting digital measurement values arrive in a continuous stream. Extracted parameters include the d.c. value of the input signal, the rms value of the input signal, the waveform parameters of the input signal, and the peak min/max values of the input signal.

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Patent Owner(s)

Patent OwnerAddress
FLUKE CORPORATION6920 SEAWAY BLVD EVERETT WA 98203

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Swift, Steven D Seattle, WA 5 109

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