Fault simulation apparatus
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United States of America Patent
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Aug 3, 1999
Grant Date -
N/A
app pub date -
Apr 21, 1997
filing date -
Nov 28, 1996
priority date (Note) -
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Abstract
A fault simulation apparatus includes an MOS transistor output signal strength determining portion for extracting the conductivity type of an MOS transistor in which an event such as a variation in signal level occurs. A control signal value is obtained from a control terminal, and an input signal value is obtained from an input terminal, and output signal strength when the event occurring MOS transistor is turned ON is determined. In the apparatus, fault simulation is performed depending upon the output signal strength determined by the output signal strength determining portion.
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