System and method for performing selected optical measurements on a sample using a diffraction grating

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United States of America Patent

PATENT NO 5943133
SERIAL NO

08984879

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system and method for performing selected optical measurements on a sample is provided utilizing an optical coherence domain reflectometer which includes a diffraction grating. A broad band light source produces light having a short coherence length. A beamsplitter splits the light into a signal beam and a reference beam. A reference mirror is disposed to receive the reference beam. A lens brings the signal beam to focus on the sample. A diffraction grating receives a reflection from the sample and from the reference mirror, the reflections being incident on the diffraction grating with respect to said diffraction grating normal such that the positive and negative first or second or higher diffraction orders from said reflections received propagate along a normal to said diffraction grating. A lens collects the diffracted orders from the diffraction grating and brings the diffracted orders to focus on a detector, the detector producing an output of said positive and negative first diffracted orders received. A computer processes the output from the detector.

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Patent Owner(s)

Patent OwnerAddress
RESEARCH FOUNDATION OF THE CITY UNIVERSITY OF NEW YORK THE555 WEST 57TH STREET NEW YORK NY 10019

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alfano, Robert R Bronx, NY 141 7099
Zeylikovich, Iosif Bronx, NY 6 276

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