Method and apparatus for selectively testing identical pins of a plurality of electronic components
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United States of America Patent
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Aug 31, 1999
Grant Date -
N/A
app pub date -
Sep 30, 1997
filing date -
Apr 19, 1995
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Apparatus for selectively testing, in parallel, identical pins of a plurality of electronic components is provided. The apparatus enables selective pins of selective electronic components to be disabled during testing so that testing can continue in connection with the identical pins of the remainder of the plurality of electronic components.
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