Semiconductor memory testing device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 5946247
SERIAL NO

09013062

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In a small-size device, one input terminals of a plurality of AND circuits are connected in series. The other terminals of the plurality of AND circuits receive failure information held by a register circuit. Among the AND circuits, by changing values at the AND circuits which are connected in an output direction (i.e., most significant bit side) of an AND circuit receiving a failure bit and values at the AND circuits which are connected in an input direction (i.e., least significant bit side) of the AND circuit receiving the failure bit, a signal line associated with the failure bit is disconnected and signal lines are re-connected to adjacent signal lines including an extra line by selectors. Hence, a failure bit is compensated in a very simple structure.

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Patent Owner(s)

  • RENESAS ELECTRONICS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maeno, Hideshi Itami, JP 46 540
Osawa, Tokuya Itami, JP 17 263

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