Method of and apparatus for nonobtrusively obtaining on-line measurements of a process control device parameter
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Oct 12, 1999
Issued Date -
N/A
app pub date -
Sep 29, 1997
filing date -
Oct 30, 1995
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An apparatus for nonobtrusively determining one or more parameters, such as dead band, dead time, or response time of a process control device that is connected on-line in a process control loop includes a measurement unit and a processing unit. The measurement unit is coupled to the process control loop to detect stochastic changes in a control signal sent to the process control device and to detect an indication of the response of the process control device to the changes in the control signal while the process control device is operating on-line. The processing unit calculates the device parameters from one or more sets of the detected changes in the control signal and the detected response indication.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully