Method and apparatus for measuring electrical noise in devices
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United States of America Patent
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Oct 19, 1999
Grant Date -
N/A
app pub date -
Aug 8, 1997
filing date -
Aug 8, 1997
priority date (Note) -
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Abstract
A method and apparatus for measuring electrical noise in devices is disclosed that comprises two distinct measurement phases. In one phase, the differential output resistance, r.sub.ab, between a first terminal, a, and a second terminal, b, of the device under test is measured. In the second phase, a voltage, V.sub.L (t), is measured across a load resistance, R.sub.L, that is in series with the first terminal, a, of the device under test. Then the output voltage noise spectral density, S.sub.VL, is determined based on a fourier transform of the voltage, V.sub.L (t); and the output current noise spectral density, S.sub.ia, is determined based on the output voltage noise spectral density, S.sub.VL, the load resistance, R.sub.L, and the differential output resistance, r.sub.ab.
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