Automatic matching device for planar point patterns and method thereof

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United States of America Patent

PATENT NO 5974176
SERIAL NO

08756523

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Abstract

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A method for automatic matching of planar point patterns in a reference pattern with a test pattern includes course mating, calculation of a mated possibility for one point in each pattern using fuzzy relaxation, preliminary selection of mated pairs based on these possibilities, and calculation of a similarity value based upon the number of mated pairs, the mated rate of the reference and test patterns, and the average mating possibility and average distance between mated points.

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Patent Owner(s)

Patent OwnerAddress
HSU WEN-HSING3F 54 PARK AVE II SCIENCE-BASED INDUSTRIAL PARK HSINCHU R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Shih-Hsu Hsinchu, TW 2 10
Hsu, Wen-Hsing 3F, 54 Park Ave. II, Science Based Industrial Park, Hsinchu, TW 15 247

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