Microscope for compliance measurement
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United States of America Patent
Stats
-
Nov 16, 1999
Issued Date -
N/A
app pub date -
Aug 4, 1997
filing date -
May 19, 1994
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An atomic force microscope and method of operation are provided and include a force sensing probe tip adapted to be brought into close proximity with a sample surface, a scanning element for generating relative movement between the probe tip and the sample surface, a device for generating a magnetic field to cause deflection of the probe tip, a driver for the device, the driver including a source of alternating current and a source of a second current of a controlled magnitude, and a detector for detecting the position of the probe tip. In a preferred mode of operation, two signals, one of alternating current and the other of a fixed, but variable, current, are applied to cause a displacement of the time-average position of the probe tip.
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