Method and apparatus for statistical process control of machines and processes having non-constant mean of a response variable

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United States of America Patent

PATENT NO 5987398
SERIAL NO

09069868

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Abstract

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A method and apparatus for analyzing a process or machine having a non-constant mean of a response variable using statistical process control techniques. Several measurements of a response variable are taken while the monitored machine is known to be operating in control. Through statistical regression techniques, a mathematical formula is derived to predict the value using indicator variables at various periods in the process. Then, while the process or machine is operating on an ongoing basis, actual measurements of the response variable are taken and compared to the predicted values using indicator variables calculated from the derived formula. Statistical process control rules are applied to the measured values of the response variable and the predicted value using indicator variables to determine if the machine or process has fallen out of control.

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Patent Owner(s)

Patent OwnerAddress
SONY CORPORATION1-7-1 KONAN MINATO-KU TOKYO 1080075 ?1080075
SONY ELECTRONICS INC1 SONY DRIVE PARK RIDGE NJ 07656

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chou, Youn-Min San Antonio, TX 1 49
Halverson, Galen Dean San Antonio, TX 1 49

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