Temperature measurement with interleaved bi-level current on a diode and bi-level current source therefor
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United States of America Patent
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Nov 23, 1999
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N/A
app pub date -
Jun 30, 1997
filing date -
Jun 30, 1997
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Abstract
Temperature measurement with interleaved bi-level current on a diode and bi-level current source therefor which provides a very accurate ratio of measurement currents through the diode without calibration and despite process and temperature variations. The bi-level current source uses a plurality N of individual current sources wherein the higher current is comprised of the sum of the N individual current sources and the lower current is comprised of one of the individual current sources, with a temperature measurement being made using N higher current/lower current measuring sequences and using a different one of the N individual current sources for each sequence. Proper selection of the value of N and proper ordering of the two currents in each of the N measuring sequences when the diode temperature is increasing or decreasing will provide an output temperature representing the temperature of the diode at the beginning of the N measurement sequences, at the end of the N measurement sequences, or half way between. Alternate methods of achieving the results of the invention are disclosed.
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