Method and device for automatic matching of planar point patterns
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United States of America Patent
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Nov 23, 1999
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N/A
app pub date -
Nov 26, 1996
filing date -
Nov 26, 1996
priority date (Note) -
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Abstract
A method for automatic matching of planar point patterns in a reference pattern with a test pattern includes course mating, calculation of a mated possibility for one point in each pattern, preliminary selection of mated pairs based on these possibilities, and calculation of a similarity value based upon the number of mated pairs, the mated rate of the reference and test patterns, and the average mating possibility and average distance between mated points.
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