Method and apparatus for asynchronously measuring frequency shifted signals

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United States of America Patent

PATENT NO 5995914
SERIAL NO

08588837

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Abstract

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A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.

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Patent Owner(s)

Patent OwnerAddress
HP HOLDINGS THREE INCSUITE 100 FIVE CENTERPOINTE DRIVE LAKE OSWEGO OR 97035

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cabot, Richard C Lake Oswego, OR 23 521

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