Method and apparatus for automatically testing electronic components in parallel utilizing different timing signals for each electronic component
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 30, 1999
Grant Date -
N/A
app pub date -
Sep 30, 1997
filing date -
Apr 11, 1995
priority date (Note) -
Expired
status (Latency Note)
Importance
Loading Importance Indicators... 
Abstract
Apparatus for selectively testing, in parallel, identical pins of a plurality of electronic components is provided. The apparatus enables testing of selective pins of selective electronic components according to different timing schemes.
Loading the Abstract Image...
OK
First Claim
Family
Loading Family data...
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully