Probe for measuring epidural pressure and elasticity of brain parenchyma
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United States of America Patent
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Dec 7, 1999
Grant Date -
N/A
app pub date -
Jan 13, 1998
filing date -
Jan 13, 1997
priority date (Note) -
Expired
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Abstract
A probe for measuring epidural pressure and the elasticity of brain parenchyma includes first and second chambers both formed of a thin film with a bag-shape so that they can contract/expand in response to introduction of first and second pressure transmission mediums, respectively, wherein the first and second chambers are independent of each other and provided in a stack. Thus a probe capable of accurately measuring epidural pressure and the elasticity of brain parenchyma can be provided.
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