System for measuring gap and mismatch between opposing parts
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United States of America Patent
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Dec 7, 1999
Grant Date -
N/A
app pub date -
Dec 2, 1997
filing date -
Dec 2, 1996
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A system for measuring gap and mismatch by optical triangulation projects two parallel light planes onto the parts to be characterized so as to form two brightness lines. The three-dimensional profiles of the parts are calculated along the brightness lines. Raw values of gap and mismatch are calculated, preferably using particular reference points and lines. These raw values are then corrected by reference to the separation between the light planes and the change in position of a reference point of the profile of one of the parts from one brightness line to the other.
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