Defective pixel detecting circuit of a solid state image pick-up device capable of detecting defective pixels with low power consumption and high precision, and image pick-up device having such detecting circuit
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United States of America Patent
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Dec 14, 1999
Issued Date -
N/A
app pub date -
Sep 16, 1998
filing date -
Aug 29, 1995
priority date (Note) -
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status (Latency Note)
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Abstract
Image pick-up device reads image pick-up signals of all the pixels of CCD only when a light intercepting plate is moved from the light non-intercepting position to the light intercepting position for the first time after a battery replacement. By comparing the image pick-up signal from each pixel with a first threshold value, a possibly defective pixels are extracted. Thereafter, by reading the image pick-up signals for a prescribed number of times from CCD, accumulated value of the image pick-up signals of each of the possibly defective pixels is calculated. Based on the result of comparison between the accumulated value corresponding to each of the possibly defective pixels and second threshold value, an actually defective pixel is specified from the possibly defective pixels.
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