Solid state temperature measurement
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United States of America Patent
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Dec 28, 1999
Grant Date -
N/A
app pub date -
Mar 25, 1998
filing date -
Mar 25, 1998
priority date (Note) -
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Abstract
In a temperature measuring circuit suitable for implementation on an integrated circuit (IC) a plurality, M, nominally unit value current sources are individually and collectively applied to a sensor such as a diode or transistor. The resulting individual V.sub.BE voltages are measured and used to form an average, V.sub.BE(AVG), of the individual voltages. The difference .DELTA.V.sub.BE between the voltage, V.sub.BE(TOT), resulting from application of all M current sources and V.sub.BE(AVG) is used to solve for temperature in a relationship that is independent of the current values used. An error-corrected version of a sigma-delta analog-to-digital converter (ADC) is used to convert the analog measurements into digital signals representative of temperature.
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