Vertical transistor and memory cell

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United States of America Patent

PATENT NO 6018176
SERIAL NO

08925394

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Abstract

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A method for manufacturing a three-dimensionally structured vertical transistor or memory cell forms a silicon-on-insulator (SOI) structure on a semiconductor substrate and sequentially deposits a drain region, a channel region and a source region on the SOI substrate structure. The transistor includes a cylinder-type gate insulation layer surrounding the channel region and a gate electrode surrounding the gate insulation layer, having increased integration. This process and structure avoid the characteristic degradation caused by the leakage current associated with the trench process and structure.

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Patent Owner(s)

Patent OwnerAddress
SPROUT-MATADOR A/SDK-5705 GLENTEVEJ 5-7 ESBJERG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lim, Byung-hak Anyang, KR 4 285

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