Multi-dimensional pattern analysis
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United States of America Patent
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Jan 25, 2000
Grant Date -
N/A
app pub date -
Sep 28, 1998
filing date -
Sep 29, 1997
priority date (Note) -
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Abstract
A pattern recognition method applicable to unique associated pattern recognition in a structured information system or structured database is presented. The process may be used to find patterns in a column which are associated with unique data values in another column, or to find the number of unique values in the second column which are paired with the same associated pattern in the first column. The technique is easily extended to more general cases in which both the condition field and the associated pattern field may be two groups of fields.
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