Machine vision methods and articles of manufacture for ball grid array inspection
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Feb 15, 2000
Grant Date -
N/A
app pub date -
Aug 31, 1995
filing date -
Jul 25, 1995
priority date (Note) -
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status (Latency Note)
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Abstract
A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred to herein as their 'observed' locations); comparing expected locations of those features with the observed locations to identify missing surface features; reinspecting the image in the vicinity of apparently missing surface features to verify if the feature is really missing or to find those features and to determine their 'observed' locations; and determining, from the observed locations of the surface features, the position and/or angle of the ball grid array surface-mounted device. The invention can be used to determine the position and/or angle of ball grid array surface-mounted devices with surface features in any of many array configurations, e.g., a regular lattice, a checker board lattice, a reverse checker board lattice, a regular lattice with a holes, and a custom lattice.
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