Thin film transistor including a catalytic element for promoting crystallization of a semiconductor film

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United States of America Patent

PATENT NO 6028326
SERIAL NO

08881257

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Abstract

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A crystalline silicon thin film transistor having an LDD (lightly doped drain) structure and a process for fabricating the same, which comprises introducing a catalyst element for accelerating crystallization at a concentration of 1.times.10.sup.15 cm.sup.-3 or more but less than 2.times.10.sup.19 cm.sup.-3 to the impurity region in an amorphous silicon film, crystallizing the amorphous film thereafter, and after forming gate electrode and gate insulating film, implanting an impurity in a self-aligned manner to establish an LDD structure.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR ENERGY LABORATORY CO LTDKANAGAWA-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Takemura, Yasuhiko Kanagawa, JP 582 31804
Uochi, Hideki Kanagawa, JP 201 9757

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