Processor condition sensing circuits, systems and methods
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United States of America Patent
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Feb 29, 2000
Issued Date -
N/A
app pub date -
Feb 4, 1992
filing date -
Sep 4, 1987
priority date (Note) -
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Abstract
The invention provides improved architectures and methods for emulation, simulation, and testability of data processing devices and systems without requiring physical probing or special test fixtures. A data processing device may include a semiconductor chip that is divided into domains. One domain may be halted and tested while another domain continues to operate. For example, the semiconductor chip may have a electronic processor domain and an analysis domain. The analysis domain may include an on-chip condition sensor that is connected to the electronic processor domain. The chip can further include control logic circuitry to allow the analysis domain to operate while the electronic processor is halted and tested.
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