Substrate tester location clamping, sensing, and contacting method and apparatus
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Mar 28, 2000
Grant Date -
N/A
app pub date -
Apr 17, 1997
filing date -
Apr 17, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.
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