Semiconductor integrated circuit system having function of automatically adjusting output resistance value
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United States of America Patent
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Apr 11, 2000
Grant Date -
N/A
app pub date -
Jul 8, 1998
filing date -
Jul 8, 1997
priority date (Note) -
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status (Latency Note)
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Abstract
A semiconductor integrated circuit system having a function of automatically adjusting an output resistance value with reference to a temperature of an LSI which is operating. When a count value obtained from a counter by counting the output of a timer becomes equal to a predetermined value, a temperature sensor measures temperatures of LSIs. If a temperature fluctuation measured from a previous measured value is greater than a predetermined width, then a control apparatus issues an output resistance value adjustment request signal to output resistance adjustment units of the LSIs. When receiving the output resistance value adjustment request signal, the output resistance value adjustment units stop the signal transmission between the LSIs, adjust output resistance values of output circuits in such a manner that the output resistance values are matched with a characteristic impedance of a transmission line, and maintains the adjusted output resistance values until the output resistance value adjustment units receive next output resistance value adjustment request signal.
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