Standardizing a spectrometric instrument

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United States of America Patent

PATENT NO 6049762
SERIAL NO

08993482

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Standardization is achieved for FTIR spectrometric instruments that effect an intrinsic distortion in spectral information, the distortion being associated with an aperture size. An idealized function of spectral line shape is specified. With a small calibration aperture, spectral data is obtained for a basic sample having known 'true' spectral data, and standard spectral data also is obtained for a standard sample. With a larger, normal sized aperture, standard spectral data is obtained again for the calibration sample. A transformation factor, that is a function of this data and the standardized function, is applied to spectral data for test samples to effect standardized information. In another embodiment, the standard sample has known true spectral data, and the basic sample is omitted. In either case, the transformation factor is applied to the sample data in logarithm form, the antilogarithm of the result effects the standardized information.

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Patent Owner(s)

Patent OwnerAddress
PERKIN ELMER LLC761 MAIN AVENUE NORWALK CT 06859

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cahill, Jerry E Trumbull, CT 13 226
Ganz, Alan M Scarsdale, NY 11 645
Hoult, Robert A Beaconsfield, GB 17 257
Huppler, David A Madison, WI 3 63
Tracy, David H Norwalk, CT 51 1675
Wang, Yongdong Wilton, CT 79 917

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