Automatic parallel electronic component testing method and equipment
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United States of America Patent
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Apr 11, 2000
Grant Date -
N/A
app pub date -
Sep 30, 1997
filing date -
Apr 19, 1995
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of automatically testing electronic components in parallel, identical pins (i; i+1) of said components interchanging test signals with at least one common test circuit (20; 20') which includes, firstly, timing generators (22a, 22b, 22c, 22d; 22'a, 22'b, 22'c, 22'd) controlled by a test programming memory (10) and, secondly, forcing circuits (24.sub.1, 24.sub.2 ; 24'.sub.1, 24'.sub.2) and comparator circuits (26.sub.1, 26.sub.2 ; 26'.sub.1, 26'.sub.2) controlled by said timing generators. In accordance with the invention, all the timing generators are assigned to said forcing circuits or to said comparator circuits in such manner as to produce synchronous test signals at said identical pins (i) of said electronic components. Applications include automatic testing of components in parallel.
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