Transistor having a barrier layer below a high permittivity gate dielectric

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United States of America Patent

PATENT NO 6051865
SERIAL NO

09189352

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Abstract

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A transistor and a method for making a transistor are described. Barrier species such as nitrogen may be introduced into a semiconductor substrate to form a barrier layer. A dielectric having a high dielectric constant, preferably a metal- and oxygen-bearing dielectric, may then be deposited upon the semiconductor substrate. The barrier layer preferably mitigates short channel effects and prevents dopant and/or metal atom migration into or out of the gate structure. The dielectric may be annealed in an oxygen-bearing atmosphere to passivate the dielectric material and to incorporate barrier species into the dielectric. Alternatively, the anneal may be performed in an inert atmosphere. Following deposition of a conductive gate material upon the dielectric, a gate conductor and gate dielectric may be patterned. Lightly doped drain impurity areas and/or source and drain impurity areas may then be formed in the semiconductor substrate.

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Patent Owner(s)

Patent OwnerAddress
ADVANCED MICRO DEVICES INC2485 AUGUSTINE DRIVE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gardner, Mark I Cedar Creek, TX 677 11091
Gilmer, Mark C Austin, TX 82 1282
Wristers, Derick J Austin, TX 140 3118

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