Method and apparatus for testing an integrated circuit device

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United States of America Patent

PATENT NO 6052806
SERIAL NO

08519192

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An integrated circuit device includes operational circuitry, for example, in the form of a memory for carrying out operations of the integrated circuit device. Additionally, at least one peripheral circuit is connected to the operational circuitry for carrying out at least one function in respect of the operational circuitry. Input means are provided to permit the input of command data in a normal mode of operation and to permit the input of test data in a test mode of operation. Control circuitry has an input to receive command data from the input means. The control circuitry is arranged to generate, in response to the command data, control signals to control at least one of the peripheral circuits in the normal mode of operation. A control bus is connected between the control circuitry and the peripheral circuits and is arranged to carry control signals from the control circuitry to at least one peripheral circuit. Test circuitry is also provided which has an input arranged to receive test data from the input means. The test circuitry also has an output connected to the control bus and is arranged such that in the test mode of operation, the test data is supplied to at least one peripheral circuit from the test circuitry via the control bus.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INC8000 SOUTH FEDERAL WAY BOISE ID 83716-9632

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beat, Robert Bristol, GB 13 98

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