System for testing circuit board integrity
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Apr 25, 2000
Grant Date -
N/A
app pub date -
Sep 11, 1996
filing date -
Sep 11, 1996
priority date (Note) -
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Abstract
A system for testing circuit boards comprising a probe network having a plurality of probes wherein each probe is adapted for contacting an end of a corresponding circuit board network and wherein each probe and network define a node having an address. The system further comprises a control device that includes a node address generator and a timing circuit having an output for outputting a pulse to the node having the address generated by the node address generator and for coupling the remaining nodes to electrical ground. The system further comprises a comparator for comparing the pulse outputted by the timing circuit to predetermined data.
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