Method and apparatus for in situ gas concentration measurement
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United States of America Patent
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May 16, 2000
Grant Date -
N/A
app pub date -
Jun 6, 1997
filing date -
Jun 6, 1997
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for in situ measurement of the concentration of a gas with a frequency modulated tunable diode laser is disclosed. The sampling cell, which is mounted in the flow of gases to be measured, is a Herriott cell. Gas enters the sampling cell through sintered metal filters that prevent entrance of particulates. Signals from a sample detector and a null detector are compared to eliminate interference patterns from the laser optics. High accuracy dynamic calibration of the apparatus is also disclosed.
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