Integrated laser imaging and spectral analysis system

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United States of America Patent

PATENT NO 6069690
SERIAL NO

09191602

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system for analyzing an object has two operating modes such as scanned imaging mode and stop scan spectral analysis mode. A beam scanner is optically connected to a laser to receive laser beams from the laser. Beam scanner also scans the beams if the system is in the scanned imaging mode. A lens (e.g., an objective lens) is optically coupled to the beam scanner to focus the beams received from the beam scanner. A sensor is optically coupled to the lens to receive the beams that reflect from the object. The sensor may detect characteristics of the beam such as color and intensity. A spectrometer is optically coupled to the objective lens. During stop scan spectral analysis mode, spectrometer generates wavelength spectrum data.

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Patent Owner(s)

Patent OwnerAddress
UNIPHASE CORPORATION163 BAYPOINTE PARKWAY SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Ken K Los Altos, CA 23 1092
Worster, Bruce Saratoga, CA 1 49
Xu, James J San Jose, CA 12 273

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