Optical substrate inspection apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6084716
SERIAL NO

09112641

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A single light emitted from a laser source is split into multiple beams. The multiple beams are illuminated by a multi-beam scanner to scan a substrate of interest. An optical system is provided for focusing the multiple beams independently on the substrate and directing a reflected light or a transmitted light of the multiple beams on the substrate. Aperture regulating members are disposed at equal intervals corresponding to the interval between the multiple beams for controlling the multiple beams directed from the substrate by the optical system. The multiple beams passed through their respective aperture regulating members are received by an optical detector assembly which detect a change in the amount of the multiple beams. The substrate is continuously moved by a movable table on a plane substantially vertical to the multiple beams and in a direction arranged at substantially a right angle to the scanning direction of the multiple beams. Then, a scanned image is produced by an image processor from a signal output of the detector assembly and data of the coordinate location of the movable table and compared by a comparator with a corresponding reference image.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOPCON;KABUSHIKI KAISHA TOSHIBA

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobayashi, Noboru Yokohama, JP 160 1872
Miwa, Akemi Kawaguchi, JP 4 63
Nagai, Hideo Nagareyama, JP 131 4852
Sanada, Yasushi Yokohama, JP 12 166
Tabata, Mitsuo Yokohama, JP 20 362
Taya, Makoto Tokyo, JP 6 67
Tojo, Toru Kanagawa-ken, JP 50 1341
Yamashita, Kyoji Yokohama, JP 58 988
Yoshino, Hisakazu Tochigi-ken, JP 20 326

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