Process for selectively etching silicon nitride in the presence of silicon oxide

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United States of America Patent

PATENT NO 6087273
SERIAL NO

09236825

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Abstract

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An improved wet etchant process is provided which has greater selectivity than existing hot phosphoric acid etching processes and which maintains a high etch rate in use. The etchant composition includes a second acid having a boiling point higher than that of the phosphoric acid.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Whonchee Boise, ID 86 1036
Torek, Kevin J Boise, ID 53 1105

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