Discrete die burn-in for nonpackaged die
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United States of America Patent
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-
Jul 18, 2000
Issued Date -
N/A
app pub date -
Jul 7, 1997
filing date -
Jun 4, 1991
priority date (Note) -
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status (Latency Note)
Importance
Abstract
A reusable burn-in/test fixture for discrete TAB die consists of two halves. The first half of the test fixture contains cavity in which die is inserted. When the two halves are assembled, the fixture establishes electrical contact with the die and with a burn-in oven. The test fixture need not be opened until the burn-in and electrical test are completed. The fixture permits the die to be characterized prior to assembly.
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