Method and apparatus for measuring gas concentration using a semiconductor laser

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United States of America Patent

PATENT NO 6091504
SERIAL NO

09082662

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system and method for determining the concentration of an analyte such as oxygen in an unknown gas sample. A Vertical Cavity Surface Emitting Laser (VCSEL) is used as a variable wavelength light source which is 'swept' through a wavelength range by varying the drive signal applied thereto. Quantitative spectroscopic analysis of the unknown gas sample is performed without the requirement of feedback circuitry for tuning the light source to the characteristic frequency of an analyte. Instead, the VCSEL is repeatedly 'swept' through a range of frequencies determined by the drive signal, and the absorption is measured by the detector. The absorption lines do not always occur at the same place but instead move along around during the sweep based on the temperature and baseline current. The absorption at a particular wavelength may be determined by overlaying the drive signal and its timing information over the detected absorption signal.

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Patent Owner(s)

Patent OwnerAddress
UDT SENSORS INC A CALIFORNIA CORPORATION12525 CHADRON AVENUE HAWTHORNE CA 90250

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Braig, James R Piedmont, CA 160 11311
Curnan, William A Boulder, CO 1 52
Goldberger, Daniel S Boulder, CO 61 9246
Nichols, Robert A Thornton, CO 6 439
Svai, Sophat Thornton, CO 1 52
Walker, Stephen D Boulder, CO 12 783

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