Method for writing data into non-volatile semiconductor memory cell

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United States of America Patent

PATENT NO 6091637
SERIAL NO

09144317

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Abstract

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A method including: a first writing step for writing data by injecting electrons into the floating gate; a first verifying step for verifying whether the threshold voltage is higher than the first reference level after performing the first writing operation; a step of repeating the first writing step and the first verifying step until the threshold voltage becomes higher than the first reference level, if the threshold voltage is lower than the first reference level; a second verifying step for verifying whether the threshold voltage is higher than a second reference level which is set to be higher than the first reference level, if the threshold voltage is higher than the first reference level; a step of ending the writing operation if the threshold voltage is lower than the second reference level; and a second writing step for writing data by discharging electrons from the floating gate until the threshold voltage becomes higher than the first reference level and lower than the second reference level, if the threshold voltage is higher than the second reference level.

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Patent Owner(s)

Patent OwnerAddress
SHARP KABUSHIKI KAISHA1 TAKUMI-CHO SAKAI-KU SAKAI CITY OSAKA 5908522 ?5908522

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hakozaki, Kenji Fukuyama, JP 5 104

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