Test circuit
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United States of America Patent
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Jul 18, 2000
Grant Date -
N/A
app pub date -
Feb 5, 1998
filing date -
Sep 19, 1997
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A test circuit includes a writing unit that outputs m-bit data captured upon receipt of a clock signal, branches the m-bit data n identical m-bit data signals, and stores the n m-bit data signals in a memory device. A function determining unit reads the n m-bit data signals from the memory, compares one of the n m-bit data signals to an m-bit expected value, and determines coincidence or non-coincidence between the n m-bit data signal and an expected value.
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