Polymer property distribution functions methodology and simulators

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6093211
SERIAL NO

09057795

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A process simulator and modeling methodology employs instantaneous property measures. The instantaneous measures of various polymer properties are tracked throughout the subject polymer manufacturing system and used to calculate respective property distribution functions. For example, property distributions of composition, molecular weight, stereoregularity and long chain branching are calculated, tracked in time and location throughout the manufacturing system, and used to model the polymer manufacturing system and polymerization process performed by the system. More specifically, the present invention calculates full distribution of polymer properties from the instantaneous property measures and tracked instantaneous property distributions. This enables accurate and computationally efficient modeling of the polymerization process and manufacturing system for carrying out the same. The present invention method and apparatus thus enables modeling of polymer manufacturing systems (a) operating under transient or steady-state conditions, using free radicals or catalysts with a plurality of active center types, and having reactor types of CSTR, PFTR or any combinations thereof operating in batch, semi-batch or continuous operation, and (b) for carrying out polymerization processes including solution, slurry, gas phase, suspension and emulsion polymerizations.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ASPENTECH CORPORATION20 CROSBY DRIVE BEDFORD MA 01730

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Chau-Chyun Lexington, MA 23 352
Hamielec, Alvin E Burlington, CA 1 84
Osias, Martine Cambridge, MA 2 202
Ramanathan, Sundaram Lexington, MA 4 120
Sirohi, Ashuraj No. Andover, MA 2 91

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation