Apparatus and method for detecting memory effect in nickel cadmium batteries
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United States of America Patent
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Jul 25, 2000
Grant Date -
N/A
app pub date -
Sep 15, 1998
filing date -
Sep 15, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention provides for a timesaving method of determining whether a nickel cadmium (NiCd) battery is stricken with memory effect. A fully charged NiCd battery under test ('test battery') is subjected to a positive sloped current charge ramp and then a negative sloped current charge ramp while continuously monitoring the battery terminal voltage. The maximum measured terminal voltage of the test battery is compared to the measured terminal voltage of a NiCd battery of the same nominal voltage and capacity and known not to have memory effect ('normal'battery). A NiCd battery is determined to have memory effect if the maximum voltage of the test battery exceeds the maximum voltage of the normal battery.
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