Method of manufacturing a semiconductor device and an apparatus for manufacturing the same

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United States of America Patent

PATENT NO 6098638
SERIAL NO

08780185

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Abstract

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In a CMP process for flatting a surface of a film on a semiconductor wafer, ionized water is used as rinsing liquid in the post-polishing step performed after the main CMP polishing step. With ionized water as rinsing liquid, abrasive particles adhered to the film surface during the main polishing step are removed.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAKAWASAKI-SHI KANAGAWA 212-0013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miyashita, Naoto Yokohama, JP 44 911
Shimomura, Mariko Yokohama, JP 6 178
Takayasu, Jun Kawasaki, JP 21 119

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