Interface apparatus for automatic test equipment
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Aug 15, 2000
Issued Date -
N/A
app pub date -
Sep 29, 1997
filing date -
Sep 1, 1994
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An interface between a test head portion of automatic test equipment and handling device such as a prober. The interface employs preloaded kinematic couplings between the test head and handling device and between the probe card and the test head. These couplings allow the probe card to be repeatedly positioned relative to the component in the handling device. They also reduce forces on the probe card to prevent distortion of the probe card. The interface provide seperate mechanical and electrical loops such that mechanical position is not dependant on the electrical structure.
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