Testing parameters of an electronic device
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United States of America Patent
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Aug 15, 2000
Issued Date -
N/A
app pub date -
Nov 22, 1999
filing date -
Nov 4, 1997
priority date (Note) -
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Abstract
A method for testing an electronic device includes causing the device to perform an operation. Using circuitry of the device, a duration of time is asynchronously measured in association with the step of causing. The operation is controlled in response to the expiration of the duration.
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