Test circuit and testing method for function testing of electronic circuits
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United States of America Patent
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Aug 22, 2000
Grant Date -
N/A
app pub date -
Feb 23, 1996
filing date -
Feb 23, 1995
priority date (Note) -
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status (Latency Note)
Importance
Abstract
An apparatus for function testing of electronic circuits includes a tester array having a terminal. A test circuit has at least two resistor elements, a common circuit node connected to the resistor elements for connection to the terminal of the tester array, and terminals of the resistor elements each being remote from the circuit node for connection to a respective output of an electronic circuit to be tested. A testing method for function testing of electronic circuits with such an apparatus includes placing the electronic circuit into a state in which signals are present at an output of the electronic circuit to be tested. The electronic circuit is function tested with respect to a resultant signal being established at the common circuit node.
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