Probe tip structure
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 12, 2000
Grant Date -
N/A
app pub date -
Dec 9, 1997
filing date -
Dec 9, 1997
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A probe tip structure is disclosed which is obtained from a solid piece of material having a bore machined therein which extends from a first end where the probe tip is attached to a coaxial transmission line to a second end where contact points are machined therein. The inner conductor of the transmission line extends into the bore to the second end of the probe tip where another contact point is formed. All contact points are adapted to contact a device under test. A rigid insulating structure is placed within the bore of the probe tip to hold the inner conductor securely in a fixed position.
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