Prober and method for cleaning probes provided therein

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6118290
SERIAL NO

09066937

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A prober including a probe card, a main chuck, a spacer, a conveying mechanism, and a supporting portion. The probe card is provided on an upper surface of a main body of the prober. The main chuck is provided in the main body of the prober, underneath the probe card, to be movable in X, Y, Z and .theta. directions. The spacer has an upper portion on which a cleaner tool for the probe card is held. The conveying mechanism for conveying the spacer between outside of the main body of the prober and a position on the main chuck. The supporting portion is provided on an outer side surface of the main chuck, for supporting the spacer. The main chuck is moved up and down directly underneath the probe card such that probes of the probe card is cleaned with the cleaner tool on the spacer held on the main chuck.

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First Claim

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nakamura, Yoshihiko Yamanashi-ken, JP 68 2553
Sugiyama, Masahiko Nirasaki, JP 59 984
Yamagata, Kazumi Yamanashi-ken, JP 9 192

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